Patent · US Expired

Test probe and connector

US6876530B2 · kind B2 · utility

5Cited by
20References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 7, 2002
Grant dateApr 5, 2005
Priority date
Expiry dateFeb 14, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/06722
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An improved probe includes a conductive tubular housing or body containing a coil spring and a conductive plunger movable in the housing and having a contact tip outwardly extending from one end of the housing. The plunger and tip are urged to a normally outward position by the bias force of the spring. The opposite end of the housing has an opening for mating with a conductive pin of a connector. The connector is retained in a mounting plate of an associated fixture and has terminal ends of desired configuration. The terminal end may include a wire-wrap pin, a crimp type terminal or wire jack for attachment to a wire, or the terminal may include a spring loaded pin for engagement with an associated electrical contact. An air tight seal may be provided between the probe and the connector and the connector may be mounted in a mounting such that when vacuum is applied to an associated test fixture, air cannot be drawn through the fixture or through the body of the probe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.