Patent · US Expired

Feedback write method for programmable memory

US6879525B2 · kind B2 · utility

27Cited by
12References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2001
Grant dateApr 12, 2005
Priority date
Expiry dateFeb 6, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2213/72
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit includes an array of state-change devices, first and second decoder circuits for selecting a particular state-change device. A voltage source is coupled to the first decoder circuit and sense circuitry is coupled to the second decoder to receive an electrical parameter from the selected state-change device and to detect a particular value of the electrical parameter. A control circuit is coupled to the voltage source, the first and second decoders, and the sense circuitry to select a first voltage from the voltage source to alter the selected state-change device and to select a second voltage from the voltage source when the sense circuitry detects the particular value of the electrical parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.