Method and apparatus to dynamically recalibrate VLSI chip thermal sensors through software control
US6879928B2 · kind B2 · utility
4Cited by
7References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 16, 2003 |
| Grant date | Apr 12, 2005 |
| Priority date | — |
| Expiry date | Apr 3, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides an integrated circuit VLSI temperature system for the calibration of threshold temperatures. A temperature sensitive ring oscillator (TSRO) generates a TSRO calibration parameter. A memory is employable to store the TSRO calibration parameter. A module is employable to determine a threshold TSRO oscillation frequency from the TSRO calibration parameter. A memory is employable for storing at least one threshold TSRO oscillation frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.