Associated grouping of embedded cores for manufacturing test
US6882159B1 · kind B1 · utility
3Cited by
0References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 25, 2003 |
| Grant date | Apr 19, 2005 |
| Priority date | — |
| Expiry date | Nov 25, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31723
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A structure and associated method for associated grouping of an alpha device with a plurality of dependent devices for a manufacturing test. The alpha device comprises at least one electrical characteristic. The plurality of dependent devices each comprise the at least one electrical characteristic. The alpha device and the plurality dependent devices are grouped together within a semiconductor device for an associated manufacturing test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.