Mark R. Taylor
16Patents
5h-index
30Co-inventors
66Inventor score
Filing activity: May 21, 1992 → Oct 19, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7497876B2 | Prosthetic implant | Performing Operations; Transporting | 82 | Expired |
| US7240266B2 | Clock control circuit for test that facilitates an at speed structural test | Physics | 14 | Expired |
| US5248930A | Wheel wall electrostatic generator | Electricity | 14 | Expired |
| US5519975A | Drainage roofing tile | Fixed Constructions | 7 | Expired |
| US7466156B2 | System of digitally testing an analog driver circuit | Physics | 6 | Active |
| US7721170B2 | Apparatus and method for selectively implementing launch off scan capability in at speed testing | Physics | 5 | Active |
| US7734968B2 | Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit) | Physics | 4 | Active |
| US6016646A | Adjustable, resilent twine guide finger for twine wrap mechanism of large round baler | Human Necessities | 4 | Expired |
| US7308630B2 | Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit) | Physics | 4 | Expired |
| US6882159B1 | Associated grouping of embedded cores for manufacturing test | Physics | 3 | Expired |
| US7779375B2 | Design structure for shutting off data capture across asynchronous clock domains during at-speed testing | Physics | 3 | Active |
| US6804803B2 | Method for testing integrated logic circuits | Physics | 3 | Expired |
| US7685542B2 | Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing | Physics | 3 | Active |
| US8538718B2 | Clock edge grouping for at-speed test | Physics | 2 | Active |
| US10436837B2 | Auto test grouping/clock sequencing for at-speed test | Physics | 0 | Active |
| US7659740B2 | System and method of digitally testing an analog driver circuit | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.