System and method for measuring transistor leakage current with a ring oscillator
US6882172B1 · kind B1 · utility
111Cited by
11References
7Claims
0Family size
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Key dates
| Filing date | Apr 16, 2002 |
| Grant date | Apr 19, 2005 |
| Priority date | — |
| Expiry date | Apr 16, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2884
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring the transistor leakage current. In one embodiment, the method involves driving a ring oscillator with a dynamic node driver having a leakage test device biased to an off state to produce a test signal. The test signal is extracted and the frequency is measured. The leakage current is estimated from the measured frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.