Patent · US Expired

Method for testing a program-controlled unit by an external test device

US6885963B2 · kind B2 · utility

1Cited by

20References

26Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Ralf Arnold · Aalen, DE
Thorsten Klose · Birkenfeld, DE
Ernst-Josef Kock · Kirchseeon, DE

Key dates

Filing date	Aug 24, 2001
Grant date	Apr 26, 2005
Priority date	—
Expiry date	Sep 3, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/2236
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method described is distinguished by the fact that an external test device brings about the execution, in a program-controlled unit, of a program that initiates, performs or supports the testing of the program-controlled unit. As a result, program-controlled units can be rapidly and reliably tested under all circumstances with minimal outlay.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.