Patent · US Expired

Method and apparatus for processing fine particle dust in plasma

US6893532B1 · kind B1 · utility

10Cited by
3References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 29, 1999
Grant dateMay 17, 2005
Priority date
Expiry dateJun 29, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/022
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An apparatus for processing particulate dust when a substrate is arranged in a high vacuum enclosure, plasma is generated in the high vacuum enclosure, and a reactive material is introduced into the high vacuum enclosure to perform processing of the substrate. At least one collecting electrode is provided around the substrate in the high vacuum enclosure other than the electrode that generates plasma, and particulates generated in plasma are efficiently removed by applying a predetermined electric potential of a direct-current or an alternating current to the collecting electrode, and thus a deposition problem onto an inner wall of the vacuum enclosure and a deterioration problem of processing accuracy and a film quality associated with flowing of the particulates onto the substrate are solved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.