Patent · US Expired

Nonvolatile semiconductor memory device

US6894931B2 · kind B2 · utility

83Cited by
8References
36Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 21, 2003
Grant dateMay 17, 2005
Priority date
Expiry dateSep 22, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3468
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A cell array is configured by arranging a plurality of electrically writable erasable nonvolatile memory cells on a semiconductor substrate. Each of the memory cells has a charge accumulation layer formed via a first gate insulating film and a gate electrode formed on the charge accumulation layer via a second gate insulating film. A control circuit controls the sequence of writing and erasing the data into and from a memory cell selected in the memory cell. In writing the data into the memory cell, a first write operation is to apply a write pulse voltage with a first step-up voltage between the gate electrode and the semiconductor substrate. A second write operation is to apply a write pulse voltage with a second step-up voltage lower than the first step-up voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.