Patent · US Expired

Semiconductor devices with scalable two transistor memory cells

US6903409B2 · kind B2 · utility

0Cited by
2References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 22, 2004
Grant dateJun 7, 2005
Priority date
Expiry dateJan 22, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/681

Abstract

Semiconductor devices having scalable two transistor memory cells, and methods of fabricating the same, are disclosed. The semiconductor devices include a semiconductor substrate having first, second and third isolation layers thereon. The first and second isolation layers are spaced apart to define a first active region therebetween, and the second and third isolation layers are likewise spaced apart to form a second active region therebetween. A cell gate is provided on each active region that includes a gate dielectric layer, a storage node, a multiple tunnel junction barrier and a source layer that are sequentially stacked. The device also includes first and second control lines that surround at least a portion of each sidewall of the cell gates. A dielectric layer may be interposed between the sidewalls of the cell gates and the control line that surrounds it. A data line connects to the cell gates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.