Patent · US Expired

Method of forming a low resistivity Ti-containing interconnect and semiconductor device comprising the same

US6906421B1 · kind B1 · utility

7Cited by
9References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 14, 1998
Grant dateJun 14, 2005
Priority date
Expiry dateAug 31, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

This invention relates to a method of forming a local interconnect and a semiconductor device comprising a local interconnect. The semiconductor device comprises:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.