Eddy current inspection method
US6907358B2 · kind B2 · utility
16Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 30, 2003 |
| Grant date | Jun 14, 2005 |
| Priority date | — |
| Expiry date | Nov 3, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/285
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A specimen is mounted in a multiaxis machine. An eddy current probe is also mounted in the machine for multiaxis movement relative to the specimen. The probe is aligned in situ with a target in the specimen by direct contact therebetween at multiple alignment sites corresponding with a numerical model of the specimen. Eddy current inspection of the target may then be conducted by moving the probe along multiple inspection sites of the target corresponding with the specimen model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.