Ui Suh
22Patents
9h-index
32Co-inventors
71Inventor score
Filing activity: Aug 3, 1999 → Nov 25, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6075593A | Method for monitoring and controlling laser shock peening using temporal light spectrum analysis | Physics | 23 | Expired |
| US6907358B2 | Eddy current inspection method | Physics | 16 | Expired |
| US7689030B2 | Methods and apparatus for testing a component | Physics | 14 | Active |
| US6570125B2 | Simultaneous offset dual sided laser shock peening with oblique angle laser beams | Mechanical Engineering; Lighting; Heating | 12 | Expired |
| US6914215B2 | Real time laser shock peening quality assurance by natural frequency analysis | Physics | 11 | Expired |
| US6296448A | Simultaneous offset dual sided laser shock peening | Chemistry; Metallurgy | 11 | Expired |
| US6629464B2 | Laser shock peening quality assurance by acoustic analysis | Physics | 11 | Expired |
| US7206706B2 | Inspection method and system using multifrequency phase analysis | Physics | 10 | Expired |
| US6422082B1 | Laser shock peening quality assurance by ultrasonic analysis | Emerging Cross-Sectional Technologies | 10 | Expired |
| US7952348B2 | Flexible eddy current array probe and methods of assembling the same | Emerging Cross-Sectional Technologies | 7 | Active |
| US7154265B2 | Eddy current probe and inspection method | Physics | 6 | Expired |
| US6570126B2 | Simultaneous offset dual sided laser shock peening using low energy laser beams | Mechanical Engineering; Lighting; Heating | 6 | Expired |
| US8269489B2 | System and method for eddy current inspection of parts with complex geometries | Physics | 5 | Active |
| US7518359B2 | Inspection of non-planar parts using multifrequency eddy current with phase analysis | Physics | 5 | Active |
| US7337651B2 | Method for performing model based scanplan generation of a component under inspection | Physics | 4 | Expired |
| US7657389B2 | Method of aligning probe for eddy current inspection | Physics | 4 | Active |
| US7817845B2 | Multi-frequency image processing for inspecting parts having complex geometric shapes | Physics | 3 | Active |
| US7436992B2 | Methods and apparatus for testing a component | Physics | 3 | Active |
| US7888932B2 | Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same | Emerging Cross-Sectional Technologies | 2 | Active |
| US6237419A | Aspherical curved element transducer to inspect a part with curved entry surface | Physics | 1 | Expired |
| US7948233B2 | Omnidirectional eddy current array probes and methods of use | Physics | 1 | Active |
| US8013599B2 | Methods and apparatus for testing a component | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.