Patent · US Expired

Method for diagnosing failure of a manufacturing apparatus and a failure diagnosis system

US6909993B2 · kind B2 · utility

11Cited by
7References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 28, 2002
Grant dateJun 21, 2005
Priority date
Expiry dateAug 28, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/80
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method for diagnosing failure of a manufacturing apparatus, includes: measuring time series data of characteristics of a reference apparatus which conducts same processes as the manufacturing apparatus, and recording the time series data of the characteristics in a system information storage unit as a system information database; reading out a recipe listed in a process control information database recorded in a process control information storage unit; driving and controlling the manufacturing apparatus, measuring time series data of the characteristics as test data, and outputting the test data in real time, in accordance with the recipe; performing calculations on the test data, and creating failure diagnosis data; and diagnosing the failure of the manufacturing apparatus using the failure diagnosis data and the system information database.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.