Patent · US Expired

Memory cell strings

US6914809B2 · kind B2 · utility

92Cited by
4References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 27, 2004
Grant dateJul 5, 2005
Priority date
Expiry dateJan 27, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C7/06
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for performing a read operation from a magnetic random access memory (MRAM) cell in a memory cell string is provided. The method includes applying a constant current through the memory cell string, measuring a first voltage across the memory cell string, applying a write sense current across the MRAM cell, measuring a second voltage across the memory cell string, and determining whether the first voltage differs from the second voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.