System and method of data reduction for improved exponential decay measurements
US6915240B2 · kind B2 · utility
1Cited by
8References
13Claims
0Family size
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Key dates
| Filing date | Nov 29, 2001 |
| Grant date | Jul 5, 2005 |
| Priority date | — |
| Expiry date | May 4, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/42
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A novel system and method for data reduction for improved exponential decay rate measurement in the present of excess low frequency noise. The system and method fit the tail of a record to a straight line wherein the straight line is extrapolated to the entire record and then subtracted from the initial data points before a logarithmic transformation is taken.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.