Patent · US Expired

Alignment methods for imprint lithography

US6916584B2 · kind B2 · utility

135Cited by
223References
49Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 1, 2002
Grant dateJul 12, 2005
Priority date
Expiry dateDec 20, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F9/00
  • WIPO fieldOther special machines
  • WIPO sectorMechanical engineering

Abstract

Described are methods for patterning a substrate by imprint lithography. Imprint lithography is a process in which a liquid is dispensed onto a substrate. A template is brought into contact with the liquid and the liquid is cured. The cured liquid includes an imprint of any patterns formed in the template. Alignment of the template with the substrate is performed prior to curing the liquid. Alignment of the template with the substrate includes rotational alignment of the template with respect to the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.