Patent · US Expired

Contact structure and production method thereof and probe contact assembly using same

US6917102B2 · kind B2 · utility

41Cited by
12References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 10, 2003
Grant dateJul 12, 2005
Priority date
Expiry dateOct 10, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R3/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors attached to a contactor carrier. The contactors are inserted in diagonal through holes on the contactor carrier and attached to the contactor carrier through adhesives. The contactor has a top end having a flat top surface, a straight diagonal beam integral with the top end and configured by an upper beam portion and a lower beam portion, and a lower end at an end of the lower beam portion to contact with a contact target. A length of the upper beam portion and a length of the lower beam portion are about the same. A probe contact assembly using the contact structure is also disclosed which incorporates a flip chip bonding technology to interconnect the components therein.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.