Patent · US Expired

System and method for characterizing optical devices

US6917750B2 · kind B2 · utility

0Cited by
11References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 29, 2003
Grant dateJul 12, 2005
Priority date
Expiry dateOct 24, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M11/337
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to systems and methods for characterizing optical devices, and particularly to one that characterizes optical devices such as fiber Bragg gratings. In one embodiment, a system and method include the use of two light sources and four detectors to detect light transmitted through an optical device both before and after the light has been transmitted in each direction through the device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.