Patent · US Expired

Planar reticle design/fabrication method for rapid inspection and cleaning

US6919146B2 · kind B2 · utility

2Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 25, 2002
Grant dateJul 19, 2005
Priority date
Expiry dateJan 31, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S430/151
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A reticle has a transparent substrate, mask shapes on the substrate, a transparent material covering the mask shapes and an optional anti-reflective material over the transparent material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.