Method of calibrating a spectroscopic device
US6919566B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 31, 2000 |
| Grant date | Jul 19, 2005 |
| Priority date | — |
| Expiry date | Jan 28, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/129
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a method of calibrating a spectroscopic device for providing a non-invasive measurement of an analyte level in a sample. The method comprises the steps of: (a) providing a plurality of calibration algorithms; (b) taking a set of non-invasive measurements on said sample with said spectroscopic device; (c) calculating a predicted set of analyte levels for each of the calibration algorithms in response to the set of non-invasive measurements, each of the predicted sets of analyte levels being characterized by a variability range, a slope, an R2 (a square of the correlation between said set of non-invasive measurements and said predicted set of analyte levels), and a standard error of prediction; and (d) selecting an appropriate calibration algorithm by using a suitability score based on the variability range, the slope, the R2 an the standard error of prediction for each of the predicted sets of analyte levels. A method of generating suitable calibration algorithms in step (a) is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.