Method and apparatus for determining fault sources for device failures
US6920596B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 22, 2002 |
| Grant date | Jul 19, 2005 |
| Priority date | — |
| Expiry date | Jul 7, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318342
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining fault sources for device failures comprises: generating failure signatures of fault sources for preselected tests; generating aggregate failure signatures for individual of the fault sources from the failure signatures; generating aggregate device test data from test data of a device for the preselected tests; generating aggregate matches by comparing the aggregate failure signatures with the aggregate device test data; and determining fault sources for device failures by comparing the test data of the device with ones of the failure signatures of fault sources corresponding to the aggregate matches. An apparatus configured to perform the method comprises at least one circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.