Patent · US Expired

Plasma treating apparatus and plasma treating method

US6921720B2 · kind B2 · utility

6Cited by
9References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 26, 2002
Grant dateJul 26, 2005
Priority date
Expiry dateMay 16, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/20
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a plasma treating apparatus for carrying out a plasma treatment over a silicon wafer 6 having a protective tape 6a stuck to a circuit formation face, the silicon wafer 6 is mounted on a mounting surface 3d which is provided on an upper surface of a lower electrode 3 formed of a conductive metal with the protective tape 6a turned toward the mounting surface 3d. When a DC voltage is to be applied to the lower electrode 3 by a DC power portion 18 for electrostatic adsorption to adsorb and hold the silicon wafer 6 onto the lower electrode 3 in the plasma treatment, the protective tape 6a is utilized as a dielectric for the electrostatic adsorption. Consequently, the dielectric can be thinned as much as possible and the silicon wafer 6 can be held by a sufficient electrostatic holding force.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.