Patent · US Expired

Latch circuit with metastability trap and method therefor

US6924682B1 · kind B1 · utility

7Cited by
4References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 10, 2003
Grant dateAug 2, 2005
Priority date
Expiry dateOct 10, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K3/0375
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

Methods and apparatus are provided for trapping metastability events to provide a metastable-free output signal. Values of an input signal compared to at least three different threshold voltages are latched at a predetermined point in time. A first intermediate signal is activate when all of the at least three corresponding latched values are in a first logic state. A second intermediate signal is activated when all of the at least three corresponding latched values are in second logic state. An output signal is placed in a first predetermined logic state in response to the second intermediate signal and is changed from the first predetermined logic state to a second predetermined logic state in response to the first intermediate signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.