Method and system for measuring characteristics of liquid crystal display driver chips
US6925415B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 25, 2003 |
| Grant date | Aug 2, 2005 |
| Priority date | — |
| Expiry date | Feb 25, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A measuring method and system for liquid crystal display driver chips applies a new method to measure voltages of driver chips, and utilizes probability and statistics for analysis and determination so as to yield a rather accurate effect even under noisy environments. Accordingly, analog-to-digital converters can be replaced for faster sampling. The measuring method and system can be implemented using comparator circuits or pin electronics cards so that the measuring procedure for driver chips is simplified. Measured results are analyzed and verified by application of probability and statistics. As such, testing of liquid crystal display driver chips is more accurate, testing time is reduced, and accuracy level is promoted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.