Integrated circuits with temperature-change and threshold-voltage drift compensation
US6933869B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 17, 2004 |
| Grant date | Aug 23, 2005 |
| Priority date | — |
| Expiry date | Mar 17, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Integrated circuits are stabilized by monitoring changes that affect circuit operation and by compensating for those changes using power supply adjustments. Changes in operating temperature and threshold voltage changes may be measured. Differential measurements may be made in which threshold voltages measured in continuously-biased monitoring circuits are compared to threshold voltages measured in intermittently-biased monitoring circuits. Temperature changes may be monitored using a temperature monitoring circuit based on an adjustable current source and a diode. Monitoring and compensation circuitry on the integrated circuits may use analog-to-digital and digital-to-analog converters controlled by a control unit to make temperature and threshold voltage measurements and corresponding compensating changes in power supply voltages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.