Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit
US6937032B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 17, 2004 |
| Grant date | Aug 30, 2005 |
| Priority date | — |
| Expiry date | May 11, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (SD) to represent electrical behavior of the device, an adapter T-parameter matrix (Ta) to represent all possible electrical paths through circuits to all device ports of the device, and a cascaded S-parameter matrix (Sc) to represent the circuits cascaded with the device. Values for the adapter T-parameter matrix are obtained either through measurement or modeling. The device cascaded with the circuits is measured to obtain values for the cascaded S-parameter matrix, permitting use of a general solution for the device S-parameter matrix as a function of the adapter T-parameter matrix and the cascaded S-parameter matrix.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.