Patent · US Expired

Integration method of a semiconductor device having a recessed gate electrode

US6939765B2 · kind B2 · utility

14Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 26, 2003
Grant dateSep 6, 2005
Priority date
Expiry dateDec 5, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/488

Abstract

Embodiments of the invention are directed to an integrated circuit device and a method for forming the device. In some embodiments of the invention, two types of transistors are formed on a single substrate, transistors: transistors having a recessed gate, and transistors having a planer gate electrode. In other embodiments, transistors having a recessed gate are formed in multiple areas of the same substrate. Additionally, gates of the transistors in more than one region may be formed simultaneously.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.