Patent · US Expired

Stacked device underfill and a method of fabrication

US6946384B2 · kind B2 · utility

219Cited by
3References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 2003
Grant dateSep 20, 2005
Priority date
Expiry dateJun 6, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2225/06524
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Numerous embodiments of a stacked device underfill and a method of formation are disclosed. In one embodiment, a method of forming stacked semiconductor device with an underfill comprises forming one or more layers of compliant material on at least a portion of the top surface of a substrate, said substrate, curing at least a portion of the semiconductor device, selectively removing a portion of the one or more layer of complaint material, and assembling the substrate into a stacked semiconductor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.