Patent · US Expired

Synchronized delta-VBE measurement system

US6957910B1 · kind B1 · utility

35Cited by
39References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 28, 2004
Grant dateOct 25, 2005
Priority date
Expiry dateApr 28, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K7/01
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A circuit in an integrated circuit for measuring temperature dependent voltages of a temperature sensing element includes a voltage generator circuit providing the temperature dependent voltages, a first sampling switch and a second sampling switch. The voltage generator circuit includes a temperature sensing element being excited by a first switched current and a second switched current. The first and second sampling switches sample a first voltage and a second voltage at the temperature sensing element while the temperature sensing element is being excited by the second current and the first current, respectively. Each of the first and second sampling switches includes a boosted switch circuit incorporating a pedestal voltage compensation circuit. The sampled first and second voltages are coupled to be stored on capacitors external to the integrated circuit. The difference between the first voltage and the second voltage is measured to determine the temperature of the integrated circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.