Patent · US Expired

Magnetic random access memory cell

US6958502B2 · kind B2 · utility

7Cited by
2References
23Claims
0Family size

Assignee

Inventor

  • Yu Lu · Ridgefield, US

Key dates

Filing dateOct 22, 2003
Grant dateOct 25, 2005
Priority date
Expiry dateNov 28, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B61/22
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A memory cell for use in a magnetic random access memory (MRAM) circuit includes at least first and second transistors formed in a semiconductor layer. A first insulating layer is formed on at least a portion of the first and second transistors. The memory cell further includes a first magnetic storage element formed on at least a portion of the first insulating layer, at least a second insulating layer formed on at least a portion of the first magnetic storage element, and at least a second magnetic storage element formed on at least a portion of the second insulating layer. The first and second magnetic storage elements are electrically connected to the first and second transistors, respectively.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.