Patent · US Expired

Method for calibrating semiconductor devices using a common calibration reference and a calibration circuit

US6958613B2 · kind B2 · utility

47Cited by

7References

14Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Georg Braun · Hersbruck, DE
Hermann Ruckerbauer · Radolfzell, DE
Simon Muff · Mering, DE

Key dates

Filing date	Sep 30, 2003
Grant date	Oct 25, 2005
Priority date	—
Expiry date	Oct 3, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG11C2207/2254
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Interface parameters for a plurality of semiconductor devices, particularly parameters for output drivers (i.e. on chip driver) and terminations (i.e. on die termination) for double data rate dynamic random access memories, are aligned using a calibration reference which is common to the semiconductor devices and is connected to calibration connections on the semiconductor devices. The semiconductor devices are calibrated in succession, in each case individually, and the calibration connection on the respective semiconductor device which is currently performing calibration is connected to an internal calibration unit by an internal switching unit in the process, and the calibration connections on all other semiconductor devices are terminated to a high impedance internally.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.