Patent · US Expired

Magnetic memory device and method of manufacturing the same

US6965138B2 · kind B2 · utility

42Cited by
5References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 7, 2003
Grant dateNov 15, 2005
Priority date
Expiry dateNov 12, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01F10/3254
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method of manufacturing a magnetic memory device includes forming an insulation layer on a substrate, forming a lower electrode on the insulation layer, forming a magneto-resistive film on an upper surface of the lower electrode, the magneto-resistive film including an insulation barrier layer and a plurality of magnetic films stacked on both sides of the insulation barrier layer, stacking a mask layer on the magneto-resistive film, performing ion etching on the magneto-resistive film, using the mask layer as a mask, thereby forming a magneto-resistive element, forming an insulation film on upper surfaces of the mask, the magneto-resistive element and the lower electrode, and etching the insulation film with an ion beam such that a side surface of the magneto-resistive element is exposed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.