Apparatus and methods for analyzing particles using light-scattering sensors and ionization sensors
US6965240B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 27, 2003 |
| Grant date | Nov 15, 2005 |
| Priority date | — |
| Expiry date | Mar 27, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/075
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods are disclosed for analyzing particles, such as coarse particulates, fine particulates (e.g., diesel particulate matter), and combustion aerosols, using light-scattering sensors and/or ionization-type sensors. In one disclosed embodiment, a particle monitor includes an ionization module and a controller adapted to receive an output signal from the ionization module. The controller is operable to translate the output signal into the mass concentration of particulate matter within the ionization chamber. In another embodiment, a particle monitor includes a light-scattering sensor and an ionization sensor. The monitor is configured to measure separate mass concentrations of sub-micrometer particles and larger dust particles in an atmosphere having both types of particles.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.