Patent · US Expired

Memory column redundancy circuitry and method for implementing the same

US6966012B1 · kind B1 · utility

18Cited by
3References
28Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 24, 2002
Grant dateNov 15, 2005
Priority date
Expiry dateNov 12, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/846
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A column redundancy circuitry and a method for implementing the same are provided. One exemplary method provides routing for an access request addressed to a defective cell. The method includes providing a redundant column within a memory circuit, the redundant column in communication with a sense amplifier. Next, a defective cell of a memory circuit is located and the address is programmed. An access request is then processed, the access request containing the address of the defective cell Finally, the access request is routed to the redundant column through enable circuitry. Some notable advantages include the conservation of surface area of the memory circuit induced by locating the redundant column within the memory circuit. The externalization of the fuse box, Built In Self Repair region and the logic circuitry from the memory core also provide increased flexibility.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.