Patent · US Expired

Colloidal silica composite films for premetal dielectric applications

US6967172B2 · kind B2 · utility

10Cited by
8References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 7, 2003
Grant dateNov 22, 2005
Priority date
Expiry dateOct 13, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02203
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A colloidal suspension of nanoparticles composed of a dense material dispersed in a solvent is used in forming a gap-filling dielectric material with low thermal shrinkage. The dielectric material is particularly useful for pre-metal dielectric and shallow trench isolation applications. According to the methods of forming a dielectric material, the colloidal suspension is deposited on a substrate and dried to form a porous intermediate layer. The intermediate layer is modified by infiltration with a liquid phase matrix material, such as a spin-on polymer, followed by curing, by infiltration with a gas phase matrix material, followed by curing, or by curing alone, to provide a gap-filling, thermally stable, etch resistant dielectric material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.