Spring contact probe device for electrical testing
US6967492B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2003 |
| Grant date | Nov 22, 2005 |
| Priority date | — |
| Expiry date | Dec 14, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07357
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a unitary spring contact probe comprising a resilient spring section, a plunger section extending from a distal end of the resilient spring section for contacting a semiconductor device under test and a stopper projecting from the plunger section substantially transversely to an axial direction of the plunger section. There is also provided an apparatus for testing a semiconductor comprising a plurality of said unitary spring contact probes, one or more insulative guiding holders for mounting the spring contact probes, and a retainer mechanism coupled to the stoppers of the spring contact probes for securing the spring contact probes to the insulative guiding holders.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.