Patent · US Expired

X-ray analyzer

US6968043B2 · kind B2 · utility

1Cited by
4References
7Claims
0Family size

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Key dates

Filing dateJul 24, 2003
Grant dateNov 22, 2005
Priority date
Expiry dateNov 30, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2223/076
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

There is disclosed an X-ray analyzer capable of precisely measuring a trace amount of cadmium contained in plastic. The analyzer has an X-ray filter assembly between an X-ray tube having an Rh target and a plastic sample. The filter assembly consists of first, second, and third X-ray filters which are made of zirconium, copper, and molybdenum, respectively. The first through third X-ray filters have thicknesses of about 100 μm, 200 μm, and 40 μm, respectively.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.