JEOL Engineering Co., Ltd.
8Patents
1Active
8Granted
27Portfolio score
Filing activity: Jun 6, 1995 → Sep 16, 2004 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6528787B2 | Scanning electron microscope | Electricity | 20 | Expired |
| US7354500B2 | Mask and apparatus using it to prepare sample by ion milling | Physics | 11 | Expired |
| US7722818B2 | Apparatus and method for preparing samples | Electricity | 7 | Active |
| US5576658A | Pulse shaping circuit | Electricity | 6 | Expired |
| US6778944B2 | Method and system for managing data | Electricity | 2 | Expired |
| US6774362B2 | Analytical method for electron microscopy | Electricity | 2 | Expired |
| US6968043B2 | X-ray analyzer | Physics | 1 | Expired |
| US6855747B2 | Method of producing ion sensitive film for ion sensor | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.