Patent · US Expired

Fabrication of semiconductor dies with micro-pins and structures produced therewith

US6972243B2 · kind B2 · utility

12Cited by
13References
21Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 30, 2003
Grant dateDec 6, 2005
Priority date
Expiry dateSep 30, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/15787
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming a semiconductor die, comprising forming a trench in a surface of the die; filing the trench with a sacrificial material; patterning the die to form a series of channels extending substantially perpendicularly to the trench; depositing a conductive material in the channels; removing at least a portion of the sacrificial material; and removing portions of the die under the trench so as to separate a portion of the die on one side of the trench from a portion on another side of the trench. The sacrificial material may be patterned so that the channels extend so as to be partially in a portion of the die and partially a portion of the sacrificial material. A series of structures are formed having dies with micro-pins.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.