Patent · US Expired

Electrical, high temperature test probe with conductive driven guard

US6975128B1 · kind B1 · utility

17Cited by
34References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 2004
Grant dateDec 13, 2005
Priority date—
Expiry dateMar 25, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/06772
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe needle apparatus having a conductive central core with alternating layers of dielectric and conductive materials is provided. The apparatus includes the conductive central core, a first layer of dielectric material applied to maintain electrical access to the conductive central core while providing continuous isolation of the conductive central core elsewhere, and a conductive driven guard layer applied around the first layer of dielectric material in electrical isolation from the conductive central core. The conductive driven guard layer is applied on the first layer of dielectric material with a mask on an end of the conductive central core to prevent the conductive driven guard layer from touching the conductive central core.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.