Bryan J. Root
44Patents
8h-index
8Co-inventors
68Inventor score
Filing activity: Feb 10, 1998 → Apr 13, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6586954B2 | Probe tile for probing semiconductor wafer | Physics | 31 | Expired |
| US6201402A | Probe tile and platform for large area wafer probing | Physics | 30 | Expired |
| US6963207B2 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Physics | 25 | Expired |
| US6975128B1 | Electrical, high temperature test probe with conductive driven guard | Physics | 17 | Expired |
| USD639757S1 | Top contact layout board in an electrical system | General | 15 | Expired |
| US6882168B2 | Probe tile for probing semiconductor wafer | Physics | 11 | Expired |
| US6992495B2 | Shielded probe apparatus for probing semiconductor wafer | Physics | 11 | Expired |
| USD639755S1 | Top contact layout board in an electrical system | General | 8 | Expired |
| US7728609B2 | Replaceable probe apparatus for probing semiconductor wafer | Physics | 5 | Active |
| USD654033S1 | Grooved wire support for a probe test core | General | 5 | Expired |
| US7626404B2 | Replaceable probe apparatus for probing semiconductor wafer | Physics | 5 | Expired |
| US7170305B2 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Physics | 5 | Expired |
| US7148710B2 | Probe tile for probing semiconductor wafer | Physics | 4 | Expired |
| US7768282B2 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Physics | 4 | Active |
| US7345494B2 | Probe tile for probing semiconductor wafer | Physics | 4 | Active |
| US8149009B2 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Physics | 3 | Active |
| USD713363S1 | Support for a probe test core | General | 3 | Active |
| US8994390B2 | Test systems with a probe apparatus and index mechanism | Physics | 2 | Active |
| US8860450B2 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Physics | 2 | Active |
| US8674715B2 | Test apparatus having a probe core with a twist lock mechanism | Emerging Cross-Sectional Technologies | 2 | Active |
| US9018966B2 | Test apparatus having a probe card and connector mechanism | Physics | 2 | Active |
| US7259577B2 | Shielded probe apparatus for probing semiconductor wafer | Physics | 2 | Expired |
| US7786743B2 | Probe tile for probing semiconductor wafer | Physics | 2 | Active |
| US11275106B2 | High voltage probe card system | Physics | 1 | Active |
| US8082842B2 | Perfluorinated polyether release agent for phase change ink members | Performing Operations; Transporting | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.