Patent · US Expired

Deskewed differential detector employing analog-to-digital converter

US6981192B2 · kind B2 · utility

7Cited by
4References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 27, 2002
Grant dateDec 27, 2005
Priority date
Expiry dateApr 29, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31908
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A pin electronics circuit for automatic test equipment includes first and second sampling circuits for sampling first and second legs of a differential signal produced by a DUT (Device Under Test). Timing signals activate the first and second sampling circuits to sample the legs of the differential signal at precisely defined instants of time to produce first and second collections of samples. To deskew the legs of a differential signal with respect to each other, corresponding features within the first and second collections are identified and a difference is taken between them. The differential skew can then be applied to correct measurements of differential signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.