Patent · US Expired

Method for making a multi-die chip

US6989582B2 · kind B2 · utility

2Cited by
27References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 2003
Grant dateJan 24, 2006
Priority date
Expiry dateJun 6, 2023

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81B2201/045
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

The present invention generally relates to a die perimeter region of a die having a microelectromechanical assembly fabricated thereon. This die perimeter region may be configured to facilitate electrically interconnecting adjacent die on a wafer. Moreover, this die perimeter region may be configured to facilitate separating the die from a wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.