Patent · US Expired

Apparatus and method for testing non-deterministic device data

US6990423B2 · kind B2 · utility

12Cited by

4References

18Claims

0Family size

Assignee

Teradyne, Inc. · US

Inventors

Benjamin J. Brown · Palo Alto, US
Peter Huber · Neubiberg, DE
Mark B. Donahue · Sherwood, US
John R. Pane · Tigard, US

Key dates

Filing date	Jun 25, 2003
Grant date	Jan 24, 2006
Priority date	—
Expiry date	Jun 25, 2023

Classification

Technology area (CPC H)Electricity
CPC primaryH04L43/50
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Automatic test equipment for testing non-deterministic packet data from a device-under-test is disclosed. The automatic test equipment includes a memory for storing expected packet data and a receiver for receiving the packet data from the device-under-test. A data validation circuit is coupled to the receiver for validating non-deterministic packet data based on the expected packet data from the vector memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.