John R. Pane
7Patents
3h-index
15Co-inventors
50Inventor score
Filing activity: May 31, 2000 → Sep 3, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6609077B1 | ATE timing measurement unit and method | Physics | 33 | Expired |
| US6990423B2 | Apparatus and method for testing non-deterministic device data | Electricity | 12 | Expired |
| US7668235B2 | Jitter measurement algorithm using locally in-order strobes | Physics | 3 | Active |
| US9134377B2 | Method and apparatus for device testing using multiple processing paths | Physics | 3 | Active |
| US7509226B2 | Apparatus and method for testing non-deterministic device data | Electricity | 1 | Expired |
| US9195261B2 | Synchronizing data from different clock domains by bridges one of the clock signals to appear to run an integer of cycles more than the other clock signal | Electricity | 0 | Active |
| US7536621B2 | Quantized data-dependent jitter injection using discrete samples | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.