Patent · US Expired

Method of fabricating a capacitor having sidewall spacer protecting the dielectric layer

US6993814B2 · kind B2 · utility

3Cited by
19References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 25, 2002
Grant dateFeb 7, 2006
Priority date
Expiry dateAug 18, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49146
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A capacitor structure is fabricated by forming a bottom plate, forming a dielectric layer overlaying the bottom plate, and forming a top plate over the dielectric layer. In addition, at least one insulating sidewall spacer that protects the dielectric layer during processing is formed along the perimeter of the top plate and overlaying a portion of the dielectric layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.