Patent · US Expired

Active area bonding compatible high current structures

US7005369B2 · kind B2 · utility

6Cited by
4References
44Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2003
Grant dateFeb 28, 2006
Priority date
Expiry dateOct 31, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/14
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit with circuits under a bond pad. In one embodiment, the integrated circuit comprises a substrate, a top conductive layer, one or more intermediate conductive layers, layers of insulating material and devices. The top conductive layer has a at least one bonding pad and a sub-layer of relatively stiff material. The one or more intermediate conductive layers are formed between the top conductive layer and the substrate. The layers of insulating material separate the conductive layers. Moreover, one layer of the layers of insulating material is relatively hard and is located between the top conductive layer and an intermediate conductive layer closest to the top conductive layer. The devices are formed in the integrated circuit. In addition, at least the intermediate conductive layer closest to the top conductive layer is adapted for functional interconnections of select devices under the bond pad.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.