Apparatus, system, and method for managing aging of an integrated circuit
US7005871B1 · kind B1 · utility
28Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2004 |
| Grant date | Feb 28, 2006 |
| Priority date | — |
| Expiry date | Jun 29, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/287
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit includes an accelerated aging circuit block that has at least one circuit that ages at a faster rate than a functional circuit block. The accelerated aging circuit block is monitored during normal operation of the integrated circuit. Changes in the accelerated aging circuit block are used to generate data indicative of an aging trend for the functional circuit block.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.