Patent · US Expired

Extending the range of lithographic simulation integrals

US7010776B2 · kind B2 · utility

44Cited by
16References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 27, 2003
Grant dateMar 7, 2006
Priority date
Expiry dateApr 19, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F1/70
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method for calculating long-range image contributions from mask polygons. An algorithm is introduced having application to Optical Proximity Correction in optical lithography. A finite integral for each sector of a polygon replaces an infinite integral. Integrating over two triangles, rather than integrating on the full sector, achieves a finite integral. An analytical approach is presented for a power law kernel to reduce the numerical integration of a sector to an analytical expression evaluation. The mask polygon is divided into regions to calculate interaction effects, such as intermediate-range and long-range effects, by truncating the mask instead of truncating the kernel function.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.